Sajal Sagar Singh

B.Tech(Hons.)-M.Tech Dual Degree Student
MEMS & Micro/Nano Systems Laboratory & Sensors and Actuators Laboratory
Department of Mechanical & Aerospace Engineering

Indian Institute of Technology Hyderabad
Telangana , India - 502 285
Phone No :+91-738 236 5161
E-mail : me11028 [at] iith [dot] ac [dot] in


Research Interests

  • Linear and Nonlinear Vibrations
  • Resonant Sensors
  • MEMS based Bio/Chemical Sensors and Actuators
  • Silicon Micromachining
  • Modeling and Simulations

Publications

Peer-reviewed International Journal

  • S.S. Singh, P. Pal and A.K. Pandey, "Mass sensitivity of non-uniform microcantilever beam,", ASME J. Vib. Acoust., 2016, [Accepted]
  • S.S. Singh, P. Pal, A.K. Pandey, Y. Xing and K. Sato, "Determination of precise crystallographic directions for mask alignment in wet bulk micromachining for MEMS (Review Article)", Micro and Nano Sys. Lett., 4(5) 2016
  • S.S. Singh, V.N. Avvaru, S. Veerla, A.K. Pandey and P. Pal "A measurement free pre-etched pattern to identify the <110> directions on Si{110} wafer.," Microsys. Technol.,2016, [Accepted]
  • S.S. Singh, P. Pal, and A.K. Pandey, "Pull-in analysis of non-uniform microcantilever beams under large deflection," J. Appl. Phys. 118(21), 042545 2015
  • S.S. Singh, S. Veerla, V. Sharma, A.K. Pandey and P. Pal,"Precise identication of <100> directions on Si{001} wafer using a novel self-aligning pre-etched technique," J. Micromech. Microeng. vol.26, no.2, pp. 025012, 2016
  • P. Pal, S. Haldar, S.S Singh, A. Ashok, Y. Xing and K. Sato "A detailed investigation and explanation of the appearance of different undercut profiles in KOH and TMAH", J. Micromech. Microeng., vol.24, no.9, pp. 095026, 2014.
  • P. Pal and S.S Singh "A simple and robust model to explain convex corner undercutting in wet bulk micromachining", Micro and Nano Sys. Lett., vol. 1, no. 1, pp. 1-6, 2013.Highly Accessed Article
  • P. Pal and S.S Singh "A new model for the etching characteristics of corners formed by Si{111} planes on Si{110} wafer surface", Engg., vol.5, no.11A, pp. 1-8, 2013.
  • S.S Singh, Y. Li, Y. Xing and P. Pal, "The Application of Level Set Method for Simulation of PECVD/LPCVD Processes", Chapter in Physics of Semiconductor Devices, Springer, pp 239-242, Dec. 2014 ISBN 978-3-319-03002-9

International Conference

  • S.S Singh , P. Pal, A.K. Pandey "Highly sensitive Microelectromechanical mass sensors using non-uniform beams", 13th International Conference on Nanomechanical Sensing (13th NMC), Delft, The Netherlands , 22-24 June 2016 [Received financial grant from Science and Engineering Research Board (SERB), Government of India to attend the conference]
  • S.S Singh , P. Pal, A.K. Pandey "Frequency and Pull-in Analysis of Non-Uniform MEMS Cantilever Beams", 18th International Workshop on Physics of Semiconductor Devices (18th IWPSD), IISc, Bangalore, India , 07-10 Dec. 2015
  • S.S Singh, Y. Li, Y. Xing and P. Pal, "Simulation of Thin Film Deposition on complex 2-D structures used in MEMS", VII Asia-Pacific Conference on Transducers and Micro/Nano Technologies (APCOT-2014), Daegu, South Korea, June 28th - July 2nd, 2014.